JPH0160792B2 - - Google Patents
Info
- Publication number
- JPH0160792B2 JPH0160792B2 JP55121507A JP12150780A JPH0160792B2 JP H0160792 B2 JPH0160792 B2 JP H0160792B2 JP 55121507 A JP55121507 A JP 55121507A JP 12150780 A JP12150780 A JP 12150780A JP H0160792 B2 JPH0160792 B2 JP H0160792B2
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- signal
- test
- test mode
- input
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Semiconductor Integrated Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55121507A JPS5745471A (en) | 1980-09-02 | 1980-09-02 | Testing circuit for semiconductor integrated circuit |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP55121507A JPS5745471A (en) | 1980-09-02 | 1980-09-02 | Testing circuit for semiconductor integrated circuit |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5745471A JPS5745471A (en) | 1982-03-15 |
JPH0160792B2 true JPH0160792B2 (en]) | 1989-12-25 |
Family
ID=14812901
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP55121507A Granted JPS5745471A (en) | 1980-09-02 | 1980-09-02 | Testing circuit for semiconductor integrated circuit |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5745471A (en]) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19528733C1 (de) * | 1995-08-04 | 1997-01-02 | Siemens Ag | Integrierte Schaltung |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5734458Y2 (en]) * | 1975-11-07 | 1982-07-29 | ||
JPS52123662A (en) * | 1976-04-09 | 1977-10-18 | Seiko Instr & Electronics Ltd | Ic inspection circuit in electronic watches |
NL7704005A (nl) * | 1977-04-13 | 1977-06-30 | Philips Nv | Geintegreerde schakeling. |
-
1980
- 1980-09-02 JP JP55121507A patent/JPS5745471A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS5745471A (en) | 1982-03-15 |
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